IAM - Computational Materials Science

Validation of three-dimensional diffraction contrast tomography reconstructions by means of electron backscatter diffraction characterization

  • Autor:

    , , , A. Graff, W.Ludwig, D. Weygand and P. Gumbsch

  • Quelle:

    Journal of Applied Crystallography, 46, (2013), 1145-1150

  • Microstructure reconstructions resulting from diffraction contrast tomography

    data of polycrystalline bulk strontium titanate were reinvestigated by means of
    electron backscatter diffraction (EBSD) characterization. Corresponding twodimensional
    grain maps from the two characterization methods were aligned
    and compared, focusing on the spatial resolution at the internal interfaces. The
    compared grain boundary networks show a remarkably good agreement both
    morphologically and in crystallographic orientation. Deviations are critically
    assessed and discussed in the context of diffraction data reconstruction and
    EBSD data collection techniques.