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materials characterization

materials characterization
type: Vorlesung (V)
semester: WS 19/20
time: 2019-10-15
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude


2019-10-22
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2019-10-29
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2019-11-05
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2019-11-12
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2019-11-19
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2019-11-26
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2019-12-03
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2019-12-10
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2019-12-17
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2020-01-07
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2020-01-14
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2020-01-21
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2020-01-28
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude

2020-02-04
09:45 - 11:15 wöchentlich
10.91 Redtenbacher-Hörsaal
10.91 Maschinenbau, Altes Maschinenbaugebäude


lecturer: Dr.-Ing. Jens Gibmeier
Prof. Dr. Reinhard Schneider
sws: 2
lv-no.: 2174586
Notes

The following methods will be introduced within this lecture:

  • microscopic methods: optical microscopy, electron microscopy (SEM/TEM), atomic force microscopy
  • material and microstructure analyses by means of X-ray, neutron and electron beams
  • analysis methods at SEM/TEM (e.g. EELS)
  • spectroscopic methods (e.g. EDS / WDS)

learning objectives:
The students have fundamental knowledge about methods of material analysis. They have a basic understanding to transfer this fundamental knowledge on problems in engineering science. Furthermore, the students have the ability to describe technical material by its microscopic and submicroscopic structure.
requirements:
none
workload:

The workload for the module “Materials Characterization” is 180 h per semester and consists of the presence during the lectures (21 h) and tutorials (12 h) as well as self-study for the lecture (99 h) and for the tutorials (48 h). 

Prerequisites

none

Bibliography

Lecture notes (will be provided at the beginning of the lecture).

Literature will be announced at the beginning of the lecture.

Content of teaching

The following methods will be introduced within this lecture:

  • microscopic methods: optical microscopy, electron microscopy (SEM/TEM), atomic force microscopy
  • material and microstructure analyses by means of X-ray, neutron and electron beams
  • analysis methods at SEM/TEM (e.g. EELS)
  • spectroscopic methods (e.g. EDS / WDS)
Workload

The workload for the module “Materials Characterization” is 180 h per semester and consists of the presence during the lectures (21 h) and tutorials (12 h) as well as self-study for the lecture (99 h) and for the tutorials (48 h).

Aim

The students have fundamental knowledge about methods of material analysis. They have a basic understanding to transfer this fundamental knowledge on problems in engineering science. Furthermore, the students have the ability to describe technical material by its microscopic and submicroscopic structure.

Exam description

The assessment consists of a certificate and an oral exam (about 25 minutes).