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ART C. SCHMIDT, J. DEKKER, P. GUMBSCH, E. ARZT: A New Approach Towards Understanding Electromigration in Al(Cu) Alloys on an Atomistic Basis. 2005-11-04 [ct]

ART C. SCHMIDT, J. DEKKER, P. GUMBSCH, E. ARZT: A New Approach Towards Understanding Electromigration in Al(Cu) Alloys on an Atomistic Basis. 2005-11-04 [ct]
Autor: C. Schmidt, J. Dekker, P. Gumbsch, E. Arzt
Quelle: Defect and Diffusion Forum, 194-199, 151-156 (2001)