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Crack-Tip Field Analyses of Silicon using Order (N) Tight-binding Methods

Crack-Tip Field Analyses of Silicon using Order (N) Tight-binding Methods
Autor: T. Kugimiya, Y. Shibutani, P. Gumbsch
Quelle: Materials Science for the 21st Century, The Society of Materials Science, JSMS, Japan, Vol. B, 285-288 (2001)