Microstructure reconstructions resulting from diffraction contrast tomographydata of polycrystalline bulk strontium titanate were reinvestigated by means of
electron backscatter diffraction (EBSD) characterization. Corresponding twodimensional
grain maps from the two characterization methods were aligned
and compared, focusing on the spatial resolution at the internal interfaces. The
compared grain boundary networks show a remarkably good agreement both
morphologically and in crystallographic orientation. Deviations are critically
assessed and discussed in the context of diffraction data reconstruction and
EBSD data collection techniques.