Stress-driven surface topography evolution in nanocrystalline Al thin films

  • Author:

    D.S. Gianola, C. Eberl, X. M. Cheng, K. J. Hemker

  • Source:

    Adv. Mat., Band 20, Seiten 303-308 (2008)

  • Stress-assisted grain growth at room temperature is identified as a plastic deformation mechanism in nanocrystalline thin films. Unique surface relief is attributed to the direct application of stress-coupled grain boundary migration theory. The figure shows a false-color SEM image of surface topography and an AFM height profile as a result of stress-assisted grain growth. A strategy for tailoring the mechanical properties of nanostructured metals is shown.