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Stress-driven surface topography evolution in nanocrystalline Al thin films

Stress-driven surface topography evolution in nanocrystalline Al thin films
Autor:

D.S. Gianola, C. Eberl,
X. M. Cheng, K. J. Hemker

Links:
Quelle:

Adv. Mat., Band 20, Seiten 303-308 (2008)

Stress-assisted grain growth at room temperature is identified as a plastic deformation mechanism in nanocrystalline thin films. Unique surface relief is attributed to the direct application of stress-coupled grain boundary migration theory. The figure shows a false-color SEM image of surface topography and an AFM height profile as a result of stress-assisted grain growth. A strategy for tailoring the mechanical properties of nanostructured metals is shown.