We support our industry partners in all matters related to materials engineering and process technology for non-metallic inorganic materials, particularly structural and functional ceramics. Our expertise covers the entire development chain – from material synthesis and processing, through pressure-assisted and pressureless sintering technologies, to the comprehensive characterization of material, component, and part properties.

Our portfolio includes not only bulk materials but also functional (thin) films and systems with functional porosity. With in-depth knowledge of powder processing and a wide range of improved sintering technologies, we offer our industrial partners comprehensive material characterization with respect to structural, (fracture-) mechanical, and physical properties. 

Our industry service contracts are ran via the KIT Campus Transfer. If you are interest in our services, please contact Prof. Dr.Sc.Eng. Furlan - head of the Institute for Applied Materials - Ceramics and Technologies (IAM-KWT) – per E-mail.

Process technology

Powder preparation Shaping Sintering
  • Powder milling
  • Powder characterization: specific surface area, particle size
  • Dry pressing uniaxial and isostatic
  • Suspension-based shaping:
    Slip and tape
  • Coatings:
    Atomic layer deposition
  • Sintering systems: temperatures up to 1700 °C
  • Oxidizing and reducing atmosphere
  • Pressure-assisted sintering (inert atmosphere up to 1500 bar)
  • Field-assisted sintering (FAST)

 

Property characterization

  • Characterization of di- and piezoelectric properties
  • Conductivity measurements
  • Impedance spectroscopy
  • Characterization of electrical sheets
  • Investigation of Soft Magnetic Composites (SMC)
  • Strength measurements
  • Hardness testing
  • Fracture toughness, R-curve behavior
  • Subcritical crack growth
  • Creep behavior

 

Microstructural characterization

from nanometer to millimeter

Electron microscopy X-ray diffraction
  • Microstructure analysis
  • (HR-) TEM in collaboration with the LEM
  • Scanning electron microscopy
  • Optical microscopy
  • Confocal microscopy
  • Phase analysis