1. Moderne Röntgenbeugung - Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker, Spieß, Lothar / Schwarzer, Robert / Behnken, Herfried / Teichert, Gerd B.G. Teubner Verlag 2005
2. H. Krischner: Einführung in die Röntgenfeinstrukturanalyse. Vieweg 1990.
3. B.D. Cullity and S.R. Stock: Elements of X-ray diffraction. Prentice Hall New Jersey, 2001.

The course gives an overview to generation and detection of x-rays as well as their interaction with matter. It provides an introduction to crystallography and describes modern measurement and analysis methods of x-ray diffraction.

It is arranged in the following units:

• Generation and properties of X-Ray's
• Crystallography
• Fundamentals and application of different measuring methods
• Qualitative and quantitative phase analysis
• Texture analysis (pole figures)
• Residual stress measurements

regular attendance: 30 hours

self-study: 90 hours

The students know the fundamentals of crystallography, the generation and detection of x-rays as well as their interaction with the microstructure of crystalline materials. They have detailed knowledge about the different methods of x-ray diffraction measurements and are able to analyse x-ray spectra using modern methods of x-ray analysis both qualitatively and quantitatively.

The assessment consists of an oral exam (20-30 min) taking place at the agreed date (according to Section 4(2), 2 of the examination regulation). The re-examination is offered upon agreement.