IAM - Materials for Electrical and Electronic Engineering

Equipment

In order to characterize new materials and components electrically as well as electrochemically innovative measurement and analysis techniques need to be designed. To satisfy the specific demands in our ongoing research and development the IAM-WET uses and developed following measurement setups and methods of analysis:

 

SOFC:

  • single cell and stack characterization measurement setups for solid oxide fuel cells (SOFC’s)
  • electrochemical high temperature impedance spectroscopy in definite gas atmospheres between 1µHz and 1GHz
  • measurement of reform kinetics of single cells using H2/H2O, CO/CO2, all types of carbon hydride (CnHm), ammonia and model reform gas as fuel gas including inert gas (e.g. N2, He, Ar) and impurities (e.g. H2S)
  • impedance spectra analysis by means of Distribution of Relaxation Times (DRT)

 

Lithium-Ion Batteries:

  • Test facilities for the characterization of small and large lithium ion cells as well as all-solid-state cells in all common cell formats (current range µA - 160 A, impedance measurements from 120 MHz - 1 mHz, temperature range -70 - 180 °C)
  • Test facilities for cyclic and calendar long-term aging (current range µA - 25 A, impedance measurements from 1 MHz - 1 mHz, temperature range -20 - 100 °C)
  • In-House developed contacting unit for the cell formats 18650, 21700, pouch, prismatic (BEV, PHEV, PHEV2) and for laboratory cells to ensure a high reproducibility
  • Cell characterization with laboratory cells (opening and preparation of commercial lithium-ion cells, In-House developed cell housing for impedance measurements in a 3-electrode-setup with a mesh reference, commercial cell housings like EL-Cell and coincells)

 

  • conductivity measuring stations (RT to 1000°C and pO2 variations between 10-20 and 1 bar)
  • test station to measure the response characteristic of fast gas sensors
  • cross sensitivity measurement setup for gas sensors
  • micro probe modul for electrical measurements of fine structures in the µ scale. Fine needles are used for contacting the strcture which can be adjusted with a precision of 1 µm using a microscope.

 

  • light and laser microscopes
  • scanning electron microscop (SEM) with FIB and EDX
  • particle sizer, rheometer
  • high temperature XRD 
  • thermal analysis upto 1500°C (TG, DSC, Dilatometer)
  • µGC, mass spectrometer, exhaust gas analysis (NOx, C3H8, SO2)

 

  • gloveboxes
  • clean room for thin and thick film preparation 
  • thick film technology: screen printing and Folienziehen?
  • thin film technology: magnetron sputtern, physical vapour deposition (PVD)

 

 

 

For further information about the measurement setups, programs and analysis methods please contact :

 
Institute for Applied Materials - Materials for Electrical ans Electronic Engineering (IAM-WET)
Karlsruhe Institute of Technology (KIT)
FZU, Bau 50.40
Adenauerring 20
D-76131 Karlsruhe
Tel.  +49-721-608-47491
Fax  +49-721-608-47492
http://www.iam.kit.edu/wet/

Ansprechpartner:

Prof. Dr.-Ing. E. Ivers-Tiffée
Tel.:+49 721 608-47491
ivers∂kit edu

Dr.-Ing. W. Menesklou
Tel.:+49 721 608-47493
menesklou∂kit edu

Dr.-Ing. André Weber
Tel.  +49-721-608-7572
weber∂kit edu