Institute for Applied Materials – Materials Science and Engineering

Materials Characterization

  • type: Vorlesung (V)
  • semester: WS 20/21
  • lecturer: Dr.-Ing. Jens Gibmeier
    apl. Prof. Dr. Reinhard Schneider
  • sws: 2
  • lv-no.: 2174586
  • information:

    The lecture will be online (asynchronous). The lecture notes, supplementary material and the recording of lecture slides with audio track will be managed via ILIAS. In addition, regular Q&A hybrid events will be offered together with the tutorial/lab course. The registration will be possible without restriction until 06.11.2020. Subsequently, registration is only possible by direct contacting Dr.-Ing. Jens Gibmeier.

Content

The following methods will be introduced within this lecture:

  • microscopic methods: optical microscopy, electron microscopy (SEM/TEM), atomic force microscopy
  • material and microstructure analyses by means of X-ray, neutron and electron beams
  • analysis methods at SEM/TEM (e.g. EELS)
  • spectroscopic methods (e.g. EDS / WDS)

learning objectives:
The students have fundamental knowledge about methods of material analysis. They have a basic understanding to transfer this fundamental knowledge on problems in engineering science. Furthermore, the students have the ability to describe technical material by its microscopic and submicroscopic structure.

Language of instructionDeutsch
Bibliography

Vorlesungsskript (wird zu Beginn der Veranstaltung ausgegeben).

Literatur wird zu Beginn der Veranstaltung bekanntgegeben.